000 00456pam a2200157a 44500
008 160408bc1991 xxu||||| |||| 00| 0 eng d
020 _a0442259328
082 _a621.38195735
_bT288d
100 _aLiu, Ruey-Wen
245 1 _aTESTING AND DIAGNOSIS OF ANALOG CIRCUITS AND SYSTEMS
260 _aNew York
_bVan Nostrand Reinhold
_cc1991
300 _axiv,248
650 _aAnalog Electronic Systems -- Testing
964 _gCIRC
997 _aA113626 s C
999 _c315805
_d315805