000 00317pam a2200133a 44500
008 160408b xxu||||| |||| 00| 0 eng d
082 _a621.38152
_bN2145
100 _aChristors, A.
245 1 _aSEMICONDUCTOR DEVICE RELIABILITY
260 _a
_b
_c
700 _aUnger, B. A.
964 _gCIRC
997 _aA108797 C
999 _c315769
_d315769