000 00422pam a2200133a 44500
008 160408b1972 xxu||||| |||| 00| 0 eng d
082 _a537.535
_bIn2
100 _aShinoda G.(Ed.,Al.,Et.)
245 1 _aProceedings of the Sixth International Conference on X-Ray Optics and Microanalysis
_cProceedings
260 _aJapan
_bUniversity Of Tokyo Press
_c1972
300 _axi, 904p.
964 _gTEXT
997 _aA61675 C
999 _c310925
_d310925