| 000 | 00443pam a2200157a 44500 | ||
|---|---|---|---|
| 008 | 160408b1985 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_a621.381537 _bF955L |
||
| 100 | _aFujiwara, Hideo | ||
| 245 | 1 | _aLOGIC TESTING AND DESIGN FOR TESTABILITY | |
| 260 |
_aCambridge _bMit Pr. _c1985 |
||
| 300 | _ax,284 | ||
| 440 |
_aMit Press Series In Computer Systems _v |
||
| 650 | _aLogic Circuits -- Testing | ||
| 964 | _gCIRC | ||
| 997 | _aA98464 s C | ||
| 999 |
_c306040 _d306040 |
||