000 00482pam a2200169a 44500
008 160408b1975 xxu||||| |||| 00| 0 eng d
082 _a621.38153042
_bR876s
100 _aRunyan, W. R.
245 1 _aSEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION
260 _aNew York
_bMcgraw-Hill
_c1975
300 _a280
440 _aTexas Instruments Electronics Series
_v
500 _aBibliographical References
650 _aSemiconductors
964 _gCIRC
997 _aA52660 s C
999 _c305559
_d305559