000 | 00509pam a2200181a 44500 | ||
---|---|---|---|
008 | 160408b1970 xxu||||| |||| 00| 0 eng d | ||
082 |
_a621.38152 _bK131c |
||
100 | _aKane, Philip F. | ||
245 | 1 | _aCHARACTERIZATION OF SEMICONDUCTOR MATERIALS | |
260 |
_aNew York _bMcgraw-Hill _c1970 |
||
300 | _a351 | ||
440 |
_aTaxas Instruments Electronics Series _v |
||
500 | _aIncludes Bibliography | ||
650 | _aSemiconductors | ||
700 | _aLarrabee, Graydon B. | ||
964 | _gCIRC | ||
997 | _aA57201 s C | ||
999 |
_c299457 _d299457 |