| 000 | 00632pam a2200205a 44500 | ||
|---|---|---|---|
| 005 | 20170329105308.0 | ||
| 008 | 160408b1980 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0854981438 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a535.3325 _bD492 1980 |
||
| 111 |
_aConference _cBrighton _d1979 |
||
| 245 | 1 |
_aElectron microscopy and analysis, 1979 (EMAG 79) _bproceedings... _cedited by T. Mulvey |
|
| 260 |
_aBristol _bInstitute Of Physics _c1980 |
||
| 300 | _axv | ||
| 440 | _aThe Institute of Physics. Conference Series Number; 52 | ||
| 650 | _aElectron Microscopy -- Congresses | ||
| 700 | _aMulvey, T., ed. | ||
| 942 | _cBK | ||
| 999 |
_c294934 _d294934 |
||