000 00443pam a2200169a 44500
008 160408b1976 xxu||||| |||| 00| 0 eng d
082 _a621.37
_bV26n
100 _aVan Dar Ziel, Aldert
245 1 _aNOISE IN MEASUREMENTS
260 _aNew York
_bJohn Wiley
_c1976
300 _aix,228
650 _aElectric Measurements
650 _aElectronic Measurements
650 _aRandom Noise Theory
964 _gCIRC
997 _aA70877 C
999 _c283157
_d283157