000			00508pam a2200181a 44500
008			160408b1970 xxu||||| |||| 00| 0 eng d
082			_a621.38152 _bK131c
100			_aKane, Philip F.
245	1		_aCHARACTERIZATION OF SEMICONDUCTOR MATERIALS
260			_aNew York _bMcgraw-Hill _c1970
300			_a351
440			_aTaxas Instruments Electronics Series _v
500			_aIncludes Bibliography
650			_aSemiconductors
700			_aLarrabee, Graydon B.
964			_gCIRC
997			_aA59929 C
999			_c283107 _d283107