000 00421pam a2200157a 44500
008 160408b1981 xxu||||| |||| 00| 0 eng d
082 _a537.622
_bR197i
100 _aRavi, K. V.
245 1 _aIMPERFECTIONS AND IMPURITIES IN SEMICONDUCTOR SILICON
260 _aNew York
_bJohn Wiley
_c1981
300 _axiv,379
650 _aSilicon
650 _aSemiconductors -- Defects
964 _gCIRC
997 _aA67317 C
999 _c282118
_d282118