| 000 | 00635pam a2200229a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20211215110359.0 | ||
| 008 | 160408b1981 xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 082 |
_a537.622 _bL284p |
||
| 100 | _aLannoo, M. | ||
| 245 | 1 | _aPOINT DEFECTS IN SEMICONDUCTORS | |
| 260 |
_aBerlin _bSpringer-Verlag _c1981 |
||
| 300 | _a265p | ||
| 440 | _aSpringer series in solid state sciences | ||
| 505 | _aContents: v. 1. Theoretical aspects. -- v. 2. experimental Aspects | ||
| 650 | _aPoint defects | ||
| 650 | _aSemiconductors -- Defects | ||
| 700 | _aBourgoin, J. | ||
| 942 | _cBK | ||
| 999 |
_c282091 _d282091 |
||