000 00415pam a2200157a 44500
008 160408b1974 xxu||||| |||| 00| 0 eng d
082 _a621.38152
_bJ832
100 _aJowett, C. E.
245 1 _aSEMICONDUCTOR DEVICES
_cTESTING AND EVALUATION
260 _aLondon
_bBusiness Books
_c1974
300 _a134
500 _aBibl. : P. 125-126
650 _aSemiconductors
964 _gCIRC
997 _aA33321 s C
999 _c263303
_d263303