| 000 | 00461pam a2200169a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1968 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a713131799 | ||
| 082 |
_a535.4 _bT57mi |
||
| 100 | _aTolansky, Samuel | ||
| 245 | 1 | _aMICROSTRUCTURES OF SURFACES, USING INTERFEROMETRY | |
| 260 |
_aN. Y. _bAmerican Elsevier Pub. Co. _cc1968 |
||
| 300 | _avi,65 | ||
| 650 | _aInterferrometer | ||
| 650 | _aSurfaces (Technology) | ||
| 964 | _gCIRC | ||
| 997 | _aA1871 C | ||
| 999 |
_c258887 _d258887 |
||