000			00535pam a2200181a 44500
008			160408b1970 xxu||||| |||| 00| 0 eng d
082			_a621.381 _bV26ns
100			_aVan Der Ziel, Aldert
245	1		_aNOISE _cSOURCES, CHARACTERIZATION, MEASUREMENT
260			_aEnglewood Cliffs, N. J. _bPrentice-Hall _c1970
300			_a184
440			_aPrentice-Hall Information And System Sciences Series _v
500			_aIncludes Bibliography
650			_aNoise
650			_aElectronic Noise
964			_gCIRC
997			_aA18631 s C
999			_c247123 _d247123