000			00520pam a2200193a 44500
008			160408b1971 xxu||||| |||| 00| 0 eng d
082			_a620.1126 _bG469mE
100			_aGlazov, V. M.
245	1		_aMICROHARDNESS OF METALS AND SEMICONDUCTORS
260			_aN. Y. _bConsultants Bureau _c1971
300			_a226
500			_aRef. : P. 216-226
650			_aHardness
650			_aMetals -- Testing
650			_aSemiconductors -- Testing
700			_aVigdorovich, V. N.
964			_gCIRC
997			_aA27250 S C
999			_c240996 _d240996