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1. ACM sigmetrics conference on measurement and modeling of computer systems : proceedings May 16-20, 1994 (USA)

Description: xi, 294p.Publisher: ACM Press, New York 1994Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 004.24 IN8] (1).

2. Proceedings : International conference on measurement and modeling of computer systems May 23-26, 1996 (USA)

Description: xii, 279p.Publisher: ACM Press, New York 1996Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 004.24 IN8] (1).

3. Measurement and modeling of computer systems : proceedings ...

by International Conference on Measurement and Modeling of Computer Systems (1997 : Seattle, Washington).

Description: x, 302p.Publisher: New York Association For Computing Machinery 1997Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 004.24 In8] (1).

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