Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1. ATOMIC FORCE MICROSCOPY FOR BIOLOGISTS

by Morris,V J,Kirby,A R | Gunning,A P.

Material type: book Book Description: xiv,332.Publisher: Imperial College Of Sc., Technology And Medicine, London Sw7 2bu c1999Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.82 M831A] (1).

2. ATOMIC FORCE MICROSCOPY IN ADHESION STUDIES

by Drelich,Jaroslaw | Mittal,Kash L.

Material type: book Book; Format: print ; Literary form: not fiction Description: x,811.Publisher: Vsp, Leiden 2005Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.82 AT71] (1).

3. ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING

by Kaupp,G.

Material type: book Book; Format: print ; Literary form: not fiction Description: xii,292.Publisher: Springer-Verlag, Berlin 2006Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.82 K166A] (1).

4. The world of nano-biomechanics : mechanical imaging and measurement by atomic force microscopy

by Ikai, Atsushi.

Material type: book Book; Format: print ; Literary form: not fiction Description: xvi.Publisher: Amsterdam Elsevier 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 571.43 Ik1w] (1).

5. Atomic force microscopy

by Eaton, Peter | West, Paul.

Material type: book Book; Format: print ; Literary form: not fiction Description: viii, 248p.Publisher: Oxford Oxford University Press 2010Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.82 Ea83a] (1).

6. Kelvin probe force microscopy : measuring and compensating electrostatic forces

by Sadewasser, Sascha, ed | Glatzel, Thilo, ed.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiv, 331p.Publisher: Berlin Springer 2012Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.825 K299] (1).

7. Molecular manipulation with atomic force microscopy

by | Duwez, Anne-Sophie, Ed.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiii, 265p.Publisher: Boca Raton Crc Press 2012Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.5 M732] (1).

8. Fundamentals of atomic force microscopy

by Reifenberger, Ronald.

Material type: book Book; Format: print ; Literary form: not fiction Description: xv, 324p.Publisher: New Jersey World Scientific 2016Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.82 R272f] (1).

9. Conductive atomic force microscopy : applications in nanomaterials

by Lanza, Mario [ed.].

Description: xix, 361p.Publisher: Weinheim Wiley 2017Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 540 C755] (1).

10. Kelvin probe force microscopy : from single charge detection to device characterization

by Glatzel, Thilo [ed.] | Sadewasser, Sascha [ed.].

Description: xxiv, 521p.Publisher: Switzerland Springer 2018Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 502.825 K299] (1).

11. Atomic force microscopy

by Voigtländer, Bert.

Edition: 2nd ed. Description: xiv, 331p.Publisher: Switzerland Springer 2019Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.5 V87a2] (1).

12. Atomic force microscopy : fundamental concepts and laboratory investigations

by Sanders, Wesley C.

Description: xiii, 139p.Publisher: Boca Raton CRC Press 2020Availability: No items available Checked out (1).

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