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DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS
by Sachdev,Manoj,Gyvez,Jose Pineda De | Agarwal,Vishwani D. Edition: 2ndMaterial type:  Book; Format:
print
; Literary form:
not fiction
Description: xx,328.Publisher: Springer,Aa Dordrecht 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 SA14D2] (1).
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CMOS SRAM circuit design and parametric test in nano-scaled technologies
: process-aware SRAM design and test
by Pavlov, Andrei | Sachdev, Manoj. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xvi, 193p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 P289c] (1).
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3.
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Emerging nanotechnologies
: test, defect tolerance and reliability
by | Tehranipoor, Mohammad, Ed. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xii, 405p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.5 Em32] (1).
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4.
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Emerging Nanotechnologies
: Test, Defect Tolerance, and Reliability /
: [electronic resource] :
by Tehranipoor, Mohammad [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
 ; Literary form:
not fiction
Description: XII, 408 p. 200 illus. online resource.Publisher: Boston, MA : Springer US, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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5.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
: Process-Aware SRAM Design and Test /
: [electronic resource] :
by Pavlov, Andrei [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XVI, 194 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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6.
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New Methods of Concurrent Checking
: [electronic resource] /
by G�essel, Michael [author.1] | Ocheretny, Vitaly [author.1 ] | Sogomonyan, Egor [author.1 ] | Marienfeld, Daniel [author.2 ] | SpringerLink (Online service)0. Source: Springer eBooks08Material type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: VIII, 182 p. online resource.Dordrecht : Springer Netherlands, 2008. Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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7.
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Introduction to Advanced System-on-Chip Test Design and Optimization
: [electronic resource] /
by Larsson, Erik [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XX, 388 p. online resource.Publisher: Boston, MA : Springer US, 2005.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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8.
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Fault Diagnosis of Analog Integrated Circuits
: [electronic resource] /
by Kabisatpathy, Prithviraj [author.] | Barua, Alok [author.1] | Sinha, Satyabroto [author.2] | SpringerLink (Online service)0. Source: Springer eBooks0Material type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: X, 182 p. online resource.Publisher: Boston, MA : Springer US, 2005.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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9.
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Data Mining and Diagnosing IC Fails
: [electronic resource] /
by Huisman, Leendert M [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XX, 250 p. 46 illus. online resource.Publisher: Boston, MA : Springer US, 2005.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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10.
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Gizopoulos / Advances in ElectronicTesting
: [electronic resource] /
by Gizopoulos, Dimitris [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XXV, 412 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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11.
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Digital Timing Measurements
: From Scopes and Probes to Timing and Jitter /
: [electronic resource] :
by Maichen, Wolfgang [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XIV, 240 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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12.
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The Core Test Wrapper Handbook
: Rationale and Application of IEEE Std. 1500™ /
: [electronic resource] :
by Silva, Francisco da [author.] | McLaurin, Teresa [author.] | Waayers, Tom [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XXIX, 276 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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13.
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Oscillation-Based Test in Mixed-Signal Circuits
: [electronic resource] /
by Sánchez, Gloria Huertas [author.] | García de la Vega, Diego Vázquez [author.] | Rueda, Adoración Rueda [author.] | Díaz, José Luis Huertas [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XVI, 452 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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14.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
: 2nd Edition /
: [electronic resource] :
by Sachdev, Manoj [editor.1] | Gyvez, Jos� Pineda de [editor.2 ] | SpringerLink (Online service)0. Source: Springer eBooks08Material type: Book; Format:
electronic
available online
; Literary form:
not fiction
Description: XXI, 328 p. online resource.Boston, MA : Springer US, 2007. Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).
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