Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Series: Frontiers in Electronic Testing ; 29
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks
Online resources:
Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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Gizopoulos / Advances in ElectronicTesting [electronic resource] / by Series: Frontiers in Electronic Testing ; 27
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks
Online resources:
Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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Digital Timing Measurements : From Scopes and Probes to Timing and Jitter /[electronic resource] : by Series: Frontiers in Electronic Testing ; 33
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks
Online resources:
Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Series: Frontiers in Electronic Testing ; 36
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Dordrecht : Springer Netherlands, 2006 In: Springer eBooks
Online resources:
Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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