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Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1.
Introduction to Advanced System-on-Chip Test Design and Optimization : [electronic resource] /

by Larsson, Erik [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XX, 388 p. online resource.Publisher: Boston, MA : Springer US, 2005.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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2.
Fault Diagnosis of Analog Integrated Circuits : [electronic resource] /

by Kabisatpathy, Prithviraj [author.] | Barua, Alok [author.1] | Sinha, Satyabroto [author.2] | SpringerLink (Online service)0.

Source: Springer eBooks0Material type: book Book; Format: electronic available online remote; Literary form: not fiction Description: X, 182 p. online resource.Publisher: Boston, MA : Springer US, 2005.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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3.
Gizopoulos / Advances in ElectronicTesting : [electronic resource] /

by Gizopoulos, Dimitris [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XXV, 412 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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4.
Digital Timing Measurements : From Scopes and Probes to Timing and Jitter / : [electronic resource] :

by Maichen, Wolfgang [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XIV, 240 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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5.
Oscillation-Based Test in Mixed-Signal Circuits : [electronic resource] /

by Sánchez, Gloria Huertas [author.] | García de la Vega, Diego Vázquez [author.] | Rueda, Adoración Rueda [author.] | Díaz, José Luis Huertas [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XVI, 452 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition / : [electronic resource] :

by Sachdev, Manoj [editor.1] | Gyvez, Jos� Pineda de [editor.2 ] | SpringerLink (Online service)0.

Source: Springer eBooks08Material type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XXI, 328 p. online resource.Boston, MA : Springer US, 2007. Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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