<![CDATA[PKK Library Search for 'pb:John Wiley and available and itype:EBK and itype:BK']]>

<![CDATA[PKK Library Search for 'pb:John Wiley and available and itype:EBK and itype:BK']]> /cgi-bin/koha/opac-search.pl?q=ccl=pb%3AJohn%20Wiley%20and%20available%20and%20itype%3AEBK%20and%20itype%3ABK&format=rss2 2 0 200 Microstructural characterization materials [2nd ed.] [Perpetual access] ISBN 9780470727133 /cgi-bin/koha/opac-detail.pl?biblionumber=563652 By Brandon, David. New Jersey John Wiley 2008 9780470727133

Place Hold on Microstructural characterization materials [2nd ed.] [Perpetual access]

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=563652 Semiconductor material and device characterization [3rd ed.] [Perpetual access] ISBN 9780471749097 /cgi-bin/koha/opac-detail.pl?biblionumber=563656 By Schroder, Dieter K.. New Jersey John Wiley & Sons 2006 9780471749097

Place Hold on Semiconductor material and device characterization [3rd ed.] [Perpetual access]

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