<![CDATA[PKK Library Search for 'au:"Schroder, Dieter K."']]>

<![CDATA[PKK Library Search for 'au:"Schroder, Dieter K."']]> /cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Schroder%2C%20Dieter%20K.%22&format=rss2 3 0 200 Semiconductor material and device characterization [3rd ed.] [Perpetual access] ISBN 9780471749097 /cgi-bin/koha/opac-detail.pl?biblionumber=563656 By Schroder, Dieter K.. New Jersey John Wiley & Sons 2006 9780471749097

Place Hold on Semiconductor material and device characterization [3rd ed.] [Perpetual access]

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=563656 Semiconductor material and device characterization ISBN 9780471739067 /cgi-bin/koha/opac-detail.pl?biblionumber=557723 By Schroder, Dieter K.. New Jersey John Wiley 2006 . xv, 779p 9780471739067

Place Hold on Semiconductor material and device characterization

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=557723 SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION ISBN 0471511048 /cgi-bin/koha/opac-detail.pl?biblionumber=327563 By Schroder, Dieter K.. New York John Wiley 1990 . xv,599 0471511048

Place Hold on SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION

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