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1. CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

by Pavlov, Andrei | Sachdev, Manoj.

Material type: book Book; Format: print ; Literary form: not fiction Description: xvi, 193p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 P289c] (1).

2. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test / : [electronic resource] :

by Pavlov, Andrei [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XVI, 194 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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