Lock-in thermography : basics and use for evaluating electronic devices and materials
By: Breitenstein, O.
Contributor(s): Warta, W.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 B74l2 (Browse shelf) | Book Request | Available | A173070 |
Total holds: 0
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