Reliability of MEMS : testing of materials and devices
By: .
Contributor(s): Tabata, Osamu, Ed | Toshiyuki, Tsuchiya, Ed.
Material type:
BookSeries: Advanced Micro And Nanosystems. Publisher: Germany Wiley-Vch 2013Description: xx, 303p.ISBN: 9783527335015.Subject(s): Microelectromechanical systems -- Reliability | MEMSDDC classification: 621.381 | R279
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.381 R279 (Browse shelf) | Available | A180313 |
Total holds: 0
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