PKK Library catalog › Results of search for 'au:"Seiler, David G. [Ed.]"'

	1.	Characterization and Metrology for ULSI Technology 2005 [Electronic resource] : AIP Conference Proceedings 788 by \| Seiler, David G. [Ed.]. Material type: Visual material Publisher: Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: A161303 GA3.1] (1). Add to cart (remove)
	2.	Characterization and Metrology for ULSI Technology by International Conference on Characterization and Metrology for ULSI Technology Richardson, Texas 2005 \| Seiler, David G.(Ed.) \| . Description: xx, 667p.Publisher: New York American Institute Of Physics,New York 2005Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.395 In8c] (1). Place hold Add to cart (remove)

PKK Library