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Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1.
DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS

by Sachdev,Manoj,Gyvez,Jose Pineda De | Agarwal,Vishwani D.

Edition: 2ndMaterial type: book Book; Format: print ; Literary form: not fiction Description: xx,328.Publisher: Springer,Aa Dordrecht 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 SA14D2] (1).

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2.
Thermal and power management of integrated circuits

by Vassighi, Arman | Sachdev, Manoj.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiii,179p.Publisher: New York Springer 2006Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 V448t] (1).

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3.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

by Pavlov, Andrei | Sachdev, Manoj.

Material type: book Book; Format: print ; Literary form: not fiction Description: xvi, 193p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 P289c] (1).

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4.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies : [electronic resource] /

by Semenov, Oleg [author.] | Sarbishaei, Hossein [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XVIII, 228 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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5.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test / : [electronic resource] :

by Pavlov, Andrei [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XVI, 194 p. online resource.Publisher: Dordrecht : Springer Netherlands, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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6.
Thermal and Power Management of Integrated Circuits : [electronic resource] /

by Vassighi, Arman [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: X, 182 p. online resource.Publisher: Boston, MA : Springer US, 2006.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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7.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition / : [electronic resource] :

by Sachdev, Manoj [editor.1] | Gyvez, Jos� Pineda de [editor.2 ] | SpringerLink (Online service)0.

Source: Springer eBooks08Material type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XXI, 328 p. online resource.Boston, MA : Springer US, 2007. Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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