Fundamentals of atomic force microscopy
By: Reifenberger, Ronald.
Material type:
BookSeries: Lessons From Nanoscience : A Lecture Note Series / Edited By Mark Lundstrom V.4. Publisher: New Jersey World Scientific 2016Description: xv, 324p.ISBN: 9789814630351.Subject(s): Atomic force microscopyDDC classification: 502.82 | R272f
Contents:
Contents: pt.1. Foundations
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 R272f (Browse shelf) | Available | A182088 |
Total holds: 0
Contents: pt.1. Foundations
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