Advances in x-ray analysis : proceedings...
By: Annual Conference On Applications Of X-Ray Analysis Denver.
Contributor(s): Pickles, William L. [ed.] | Barrett, Charles S. [ed.] | Newkirk, John B. [ed.] | Ruud, Clayton O. [ed.].
Publisher: New York Plenum Press 1974Description: xix, 642p.Subject(s): X-Ray-Industrial Applications -- CongsDDC classification: 543.085 | C76 v.18| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 543.085 C76 (Browse shelf) | Book Request | v. 18 | Available | A45331 |
Total holds: 0
Conference Sponsored By University Of Denver, Denver Research Institute
There are no comments for this item.