IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS
By: Orlando, Auciello, Alan R Krauss.
Contributor(s): Krauss,Alan R.
Material type: BookPublisher: John Wiley, New York 2001Description: xi,263.ISBN: 0471241415.Subject(s): Thin FilmsDDC classification: 530.4275 | IN2Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 530.4275 IN2 (Browse shelf) | Available | A133206 |
Total holds: 0
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