Scanning probe microscopy : atomic scale engineering by forces and currents
By: Foster, A.
Contributor(s): Hofer, W.
Material type:
BookSeries: Nanoscience And Technology / Edited By P. Avouris. Publisher: New York Springer 2006Description: xiv, 281p.ISBN: 9780387400907.Subject(s): Scanning probe microscopy | Molecular structure | NanotechnologyDDC classification: 502.82 | F811s
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 F811s (Browse shelf) | Available | A180047 |
Total holds: 0
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