IMAGE BASED MEASUREMENT SYSTEMS
By: Heijden,Ferdin.
Contributor(s): Vande.
Material type:
BookPublisher: John Wiley, Chichester c1994Description: viii,338.ISBN: 0471950629.Subject(s): Pattern RecognitionDDC classification: 621.367 | H363I
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.367 H363I (Browse shelf) | Book Request | Available | A119969 |
Total holds: 0
Includes Index
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