FAILURE ANALYSIS OF ELECTRONIC PARTS LABORATORY METHODS
By: Anstead,Robert J.
Contributor(s): Goldberg,Ethan.
Material type: BookSeries: National Aeronautics And Space Administration Sp-6508. Publisher: Nasa, Washington, D.C. 1975Description: 79.DDC classification: TR | NASA-6508Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | TR NASA-6508 (Browse shelf) | Not for loan | TR4881 |
Total holds: 0
Bound With: Nasa Sp-6007-6508
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