<![CDATA[PKK Library Search for 'su:{X-ray microanalysis}']]>

<![CDATA[PKK Library Search for 'su:{X-ray microanalysis}']]> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%7BX-ray%20microanalysis%7D&format=rss2 8 0 200 X-RAY MICROANALYSIS IN BIOLOGY ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=297901 By Hayat, M. A.. London Macmillan 1980 . viii,488

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=297901 Scanning electron microscopy and X-Ray microanalysis ISBN 0306441756 /cgi-bin/koha/opac-detail.pl?biblionumber=327806 By Goldstein, Joseph I.. New York Plenum Press 1992 . xviii 820p 0306441756

Place Hold on Scanning electron microscopy and X-Ray microanalysis

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=327806 Scanning electron microscopy and x-ray microanalysis ISBN 0306472929 /cgi-bin/koha/opac-detail.pl?biblionumber=345263 New York Kluwer Academic / Plenum Publishers 2003 . xix, 689p , Includes Bibliographical References And Index | With Cd-Rom 0306472929

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=345263 PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY ISBN 0 387 25800 0 /cgi-bin/koha/opac-detail.pl?biblionumber=354307 By Egerton,Ray F.. Springer Science+Business Media Inc., New York 2005 . v,202 0 387 25800 0

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=354307 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS ISBN 0306421402 /cgi-bin/koha/opac-detail.pl?biblionumber=356649 By Newbury,Dale E.. Kluwer Academic / Plenum Publishers,New York 1986 . xii,454 0306421402

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=356649 X - ray microscopy and x- ray microanalysis ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=386772 Amsterdam Elsevier Publishing 1960 . x, 540p

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=386772 X-ray microscopy and x-ray microanalysis ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=452636 Amsterdam Elsevier Publishing 1960 . x, 535p

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=452636 Scanning electron microscopy and x-ray microanalysis [3rd ed.] [Perpetual] ISBN 9781461502159 /cgi-bin/koha/opac-detail.pl?biblionumber=563582 New York Springer 2003 . xix, 708p 9781461502159

Place Hold on Scanning electron microscopy and x-ray microanalysis [3rd ed.] [Perpetual]

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