<![CDATA[PKK Library Search for 'su:{Electronics and Microelectronics, Instrumentation.1}']]>

<![CDATA[PKK Library Search for 'su:{Electronics and Microelectronics, Instrumentation.1}']]> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%7BElectronics%20and%20Microelectronics%2C%20Instrumentation.1%7D&format=rss2 5 0 200 Silicon Quantum Integrated Circuits ISBN 9783540263821 /cgi-bin/koha/opac-detail.pl?biblionumber=508302 By Kasper, Erich.. . XII, 364 p. 9783540263821

Place Hold on Silicon Quantum Integrated Circuits

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=508302 Force Sensors for Microelectronic Packaging Applications ISBN 9783540269458 /cgi-bin/koha/opac-detail.pl?biblionumber=508312 By Schwizer, J�rg.. . VIII, 178 p. 9783540269458

Place Hold on Force Sensors for Microelectronic Packaging Applications

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=508312 METHODOLOGY FOR THE DIGITAL CALIBRATION OF ANALOG CIRCUITS AND SYSTEMS ISBN 9781402042539 /cgi-bin/koha/opac-detail.pl?biblionumber=508557 By Pastre, Marc.. . XVIII, 254 p. 9781402042539

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=508557 Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN 9780387465470 /cgi-bin/koha/opac-detail.pl?biblionumber=509496 . XXI, 328 p. 9780387465470

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=509496 Model Predictive control ISBN 9780857293985 /cgi-bin/koha/opac-detail.pl?biblionumber=509554 By Camacho, E. F.. . XXII, 405 p. 9780857293985

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