<![CDATA[PKK Library Search for 'pb:John Wiley and su-to:Semiconductors and su-ut:Semiconductors and se:Wiley Series In Solid State Devices And Circuits']]>

<![CDATA[PKK Library Search for 'pb:John Wiley and su-to:Semiconductors and su-ut:Semiconductors and se:Wiley Series In Solid State Devices And Circuits']]> /cgi-bin/koha/opac-search.pl?q=ccl=pb%3AJohn%20Wiley%20and%20su-to%3ASemiconductors%20and%20su-ut%3ASemiconductors%20and%20se%3AWiley%20Series%20In%20Solid%20State%20Devices%20And%20Circuits&format=rss2 2 0 200 RALIABILITY AND DEGRADATION ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=299459 By Howes, M. J.. Chichester John Wiley 1981 . xii,444

Place Hold on RALIABILITY AND DEGRADATION

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=299459 RALIABILITY AND DEGRADATION ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=300277 By Howes, M. J.. Chichester John Wiley 1981 . xii,444

Place Hold on RALIABILITY AND DEGRADATION

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=300277