<![CDATA[PKK Library Search for 'au:"Yacobi,B. G."']]>

<![CDATA[PKK Library Search for 'au:"Yacobi,B. G."']]> /cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Yacobi%2CB.%20G.%22&format=rss2 3 0 200 MICROANALYSIS OF SOLIDS ISBN 030644433X /cgi-bin/koha/opac-detail.pl?biblionumber=318166 New York Plenum Press 1994 . xiii,460p 030644433X

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=318166 SEMICONDUCTOR MATERIALS ISBN 0306473615 /cgi-bin/koha/opac-detail.pl?biblionumber=347267 By Yacobi,B. G.. Kluwer Academic / Plenum Publishers, New York 2003 . ix,228 0306473615

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=347267 Extended defects in semiconductors: electronic properties ISBN /cgi-bin/koha/opac-detail.pl?biblionumber=374248 By Holt, D. B.. Cambridge Cambridge University Press 2007 . xi, 631p

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