<![CDATA[PKK Library Search for 'au:"Aliev, Telman."']]>

<![CDATA[PKK Library Search for 'au:"Aliev, Telman."']]> /cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Aliev%2C%20Telman.%22&format=rss2 2 0 200 Digital noise monitoring of defect origin ISBN 9780387717531 /cgi-bin/koha/opac-detail.pl?biblionumber=361674 By Aliev, Telman. New York Springer Science+Business Media 2007 . xii, 223p 9780387717531

Place Hold on Digital noise monitoring of defect origin

]]> /cgi-bin/koha/opac-detail.pl?biblionumber=361674 Digital Noise Monitoring of Defect Origin ISBN 9780387717548 /cgi-bin/koha/opac-detail.pl?biblionumber=509541 By Aliev, Telman.. . XII, 224 p. 9780387717548

Place Hold on Digital Noise Monitoring of Defect Origin

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