620.11299  / B734m2 <br/>
Brandon, David  <br/>
       Microstructural characterization of materials [2nd ed.] 
 / David Brandon and Wayne D. Kaplan 
 .- 2nd ed. 
 .- Chichester: John Wiley & Sons,  2008 
 .- xiv, 536p . 
.- ( Quantitative software engineering series   
<br><u>ISBN:</u> 9780470027844 
<br/><u>Subject Headings:</u> <br/>Materials -- Microscopy;
<br/><U>Author Added Entry: </u><br/>Kaplan, Wayne d.;
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