502.825  / Eg26p2 <br/>
R.F. Egerton <br/>
       Physical principles of electron microscopy [2nd ed.] [Perpetual access] : an introduction to TEM, SEM, and AEM 
 / R.F. Egerton 
 .- 2nd ed. 
 .- Switzerland: Springer,  2016 
 .- xi,196p. 
<br><u>ISBN:</u> 9783319398778 
<br/><u>Subject Headings:</u> <br/>Electron microscopy;<br/>Microscopy;<br/>Nanotechnology;
<br><U>Copy Details:</u><br> Acc. No.: <b>EBK10737</b>, Full Call No.: 502.825 Eg26p2,   Item type:  E books , Location: Electronic Resources, <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>