Norris, L. Fredrick <br/>
       Feasibility study of secondary emission electron microscopy for examining materials containing dispersed oxide particles 
 / 
 .- Virginia:
 .- 48p. 
<br/><u>Subject Headings:</u> <br/>Microscopy;
<br/><U>Author Added Entry: </u><br/>Cremens, Walter.S;
<br><U>Copy Details:</u><br> Acc. No.: <b>83101 [D-3650]</b>, Full Call No.: ,   Item type:  Technical Report , Location: COMPACT STORAGE (BASEMENT), <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>