Norris, L. Fredrick  <br/>
       Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [NASA TN D-3658] 
 / L. Fredrick Norris, Walter S. Cremens and Jhon W. Weeton 
 .- Washington, D.C.: National Aeronautics and Space Administration,  1966 
 .- 6p. 
.- ( National Aeronautics and Space Administration (NASA)   
<br/><u>Subject Headings:</u> <br/>Overlay copy technique;
<br/><U>Author Added Entry: </u><br/>Norris, L. Fredrick;<br/>Cremens, Walter S;<br/>Weeton, John W;
<br><U>Copy Details:</u><br> Acc. No.: <b>67640 [D-3658]</b>, Full Call No.: ,   Item type:  Technical Report , Location: COMPACT STORAGE (BASEMENT), <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>