Technical Report No. 32-891 to 900  
 / 
 .- Washington, DC: National Aeronautics and Space Administration [NASA],  1966 
 .- various pages. 
<br/>TR No. 32-891 : Pulse height defect and energy dispersion in semiconductor detectors / by Eldon L. Haines and A. Bruce Whitehead (Reprinted from the Reviews of scientific instruments, Vol. 37 no. 2, pp. 190-194, February 1966) TR No. 32-892 : Variance of spectral estimates / by Eugene R. Rodemich TR No. 32-893 : Spectral analysis applied to a digitally coded PM RF carrier / by R. C. Woodbury TR No. 32-894 : Interferometric measurement of large indices of refraction / by Michael S. Shumate 
<br/><u>Subject Headings:</u> <br/>Pulse height defect;
<br><U>Copy Details:</u><br> Acc. No.: <b>84757</b>, Full Call No.: ,   Item type:  Technical Report , Location: COMPACT STORAGE (BASEMENT), <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>