620.115 <br/>
       Scanning Microscopy for Nanotechnology : Techniques and Applications /  [electronic resource] : 
 / edited by Weilie Zhou, Zhong Lin Wang. 
 .- XIV, 522 p. 399 illus..  online resource. 
<br/><label>LC Class. No.: </label>T174.7 TA418.9.N35 
<br><u>ISBN:</u> 9780387396200 
<br/><label>Standard No.: </label>10.1007/978-0-387-39620-0  doi 
<br/><u>Subject Headings:</u> <br/>Materials science.;<br/>Physical measurements.;<br/>Measurement.;<br/>Optical materials.;<br/>Electronic materials.;<br/>Nanotechnology.;<br/>Materials Science.;<br/>Nanotechnology.;<br/>Characterization and Evaluation of Materials.;<br/>Optical and Electronic Materials.;<br/>Measurement Science and Instrumentation.;
<br/><U>Author Added Entry: </u><br/>Zhou, Weilie.;<br/>Wang, Zhong Lin.;
<br><U>Copy Details:</u><br> Acc. No.: <b>EBK9445</b>, Full Call No.: ,   Item type:  E books , Location: , <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>