620.11 <br/>
Alford, Terry L. <br/>
       Fundamentals of Nanoscale Film Analysis  [electronic resource] / 
 / by Terry L. Alford, Leonard C. Feldman, James W. Mayer. 
 .- XIV, 336 p..  online resource. 
<br/><label>LC Class. No.: </label>TA404.6 
<br><u>ISBN:</u> 9780387292618 
<br/><label>Standard No.: </label>10.1007/978-0-387-29261-8  doi 
<br/><u>Subject Headings:</u> <br/>Materials science.;<br/>Condensed matter.;<br/>Solid state physics.;<br/>Spectroscopy.;<br/>Microscopy.;<br/>Nanotechnology.;<br/>Materials;--Surfaces.<br/>Thin films.;<br/>Materials Science.;<br/>Characterization and Evaluation of Materials.;<br/>Surfaces and Interfaces, Thin Films.;<br/>Nanotechnology.;<br/>Solid State Physics.;<br/>Spectroscopy and Microscopy.;<br/>Condensed Matter Physics.;
<br/><U>Author Added Entry: </u><br/>Feldman, Leonard C.;<br/>Mayer, James W.;
<br><U>Copy Details:</u><br> Acc. No.: <b>EBK9426</b>, Full Call No.: ,   Item type:  E books , Location: , <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>