620.5 <br/>
Kaupp, Gerd. <br/>
       Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces /  [electronic resource] : 
 / by Gerd Kaupp. 
 .- XII, 292 p..  online resource. 
<br/><label>LC Class. No.: </label>T174.7 
<br><u>ISBN:</u> 9783540284727 
<br/><label>Standard No.: </label>10.1007/978-3-540-28472-7  doi 
<br/><u>Subject Headings:</u> <br/>Engineering.;<br/>Science.;<br/>Physical chemistry.;<br/>Optics.;<br/>Optoelectronics.;<br/>Plasmons (Physics).;<br/>Nanotechnology.;<br/>Engineering.;<br/>Nanotechnology and Microengineering.;<br/>Science, general.;<br/>Physical Chemistry.;<br/>Nanotechnology.;<br/>Optics, Optoelectronics, Plasmonics and Optical Devices.;<br/>Engineering, general.;
<br><U>Copy Details:</u><br> Acc. No.: <b>EBK8619</b>, Full Call No.: ,   Item type:  E books , Location: , <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>