620.5 <br/>
       Applied Scanning Probe Methods III : Characterization /  [electronic resource] : 
 / edited by Bharat Bhushan, Harald Fuchs. 
 .- XLIV, 378 p. 270 illus., 2 illus. in color..  online resource. 
  ** NanoScience and Technology,  1434-4904  )
<br/><label>LC Class. No.: </label>T174.7 
 - NanoScience and Technology, .
<br><u>ISBN:</u> 9783540269106 
<br/><label>Standard No.: </label>10.1007/b138285  doi 
<br/><u>Subject Headings:</u> <br/>Engineering.;<br/>Polymers.;<br/>Surfaces (Physics).;<br/>Interfaces (Physical sciences).;<br/>Thin films.;<br/>Spectroscopy.;<br/>Microscopy.;<br/>Nanotechnology.;<br/>Materials;--Surfaces.<br/>Engineering.;<br/>Nanotechnology and Microengineering.;<br/>Spectroscopy and Microscopy.;<br/>Surface and Interface Science, Thin Films.;<br/>Nanotechnology.;<br/>Surfaces and Interfaces, Thin Films.;<br/>Polymer Sciences.;
<br/><U>Author Added Entry: </u><br/>Bhushan, Bharat.;<br/>Fuchs, Harald.;
<br><U>Copy Details:</u><br> Acc. No.: <b>EBK8597</b>, Full Call No.: ,   Item type:  E books , Location: , <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>