620.11
Foster, Adam.
牋牋牋 Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents / [electronic resource] : / by Adam Foster, Werner Hofer. .- XIV, 282 p.. online resource. ** NanoScience and Technology, 1434-4904 )
LC Class. No.: TA404.6 - NanoScience and Technology, .
ISBN: 9780387372310
Standard No.: 10.1007/0-387-37231-8 doi
Subject Headings:
Materials science.;
Atomic structure.;
Molecular structure.;
Spectra.;
Solid state physics.;
Spectroscopy.;
Microscopy.;
Nanotechnology.;
Materials;--Surfaces.
Thin films.;
Materials Science.;
Characterization and Evaluation of Materials.;
Nanotechnology.;
Surfaces and Interfaces, Thin Films.;
Atomic/Molecular Structure and Spectra.;
Solid State Physics.;
Spectroscopy and Microscopy.;
Author Added Entry:
Hofer, Werner.;
Copy Details:
Acc. No.: EBK8500, Full Call No.: , Item type: E books , Location: ,
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