620.11
Egerton, Ray F.
Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM / [electronic resource] :
/ by Ray F. Egerton.
.- XII, 202 p. 122 illus.. online resource.
TA404.6
ISBN: 9780387260167
10.1007/b136495 doi
Subject Headings: Materials science.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Nanotechnology.; Biological Microscopy.;
Copy Details: Acc. No.: EBK8462, Full Call No.: , Item type: E books , Location: , ------------------------- --------------------- ------ --------- ------- ------- --------- --------