621.395 / Sy87
System on chip test architectures : Nanometer design for testability
/ edited by Laung-Terng wang, Charles E. Stroud and Nur A. Touba
.- Amsterdam: Elsevier, 2008
.- xix, 856p.
.- ( The Morgan Kaufmann series in systems on silicon / edited by Wayne Wolf
ISBN: 9780123739735
Subject Headings:
System on a chip -- Testing;
Integrated circuits -- Very large scale integration -- Testing;
Author Added Entry:
Wang, Laung-Terng [ed.];
Stroud, Charles E. [ed.];
Touba, Nur A. [ed.];
Copy Details:
Acc. No.: A161217, Full Call No.: 621.395 Sy87, Item type: Books , Location: General Stacks,
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