GOI-DAE  / IGC-246/2003 <br/>
Krishnaiah,M V,Asuvathraman,R <br/>
       MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER 
 / 
 .-  Indira Gandhi Centre For Atomic Research, Kalpakkam,  2003 
 .- v,24 . 
.- ( Indira Gandhi Centre     
<br/><u>Subject Headings:</u> <br/>Automation;<br/>X-Ray Diffraction;
<br/><U>Author Added Entry: </u><br/>Parthasarathi,R;
<br><U>Copy Details:</u><br> Acc. No.: <b>TR20635</b>, Full Call No.: GOI-DAE IGC-246/2003,   Item type:  Technical Report , Location: General Stacks, <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>